Surface science insight note: Optimizing XPS instrument performance for quantification of spectra
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DOI: 10.1002/sia.7296
Abstract: X‐ray photoelectron spectroscopy (XPS) provides quantitative information from photoemission peaks and shapes observed within the background due to the inelastic scattering of photoelectrons. To quantify the signal, both photoemission peaks and background in spectra must… read more here.
Keywords: transmission; quantification; quantification spectra; science insight ... See more keywords
Surface Analysis Insight Note: Uncertainties in XPS Elemental Quantification
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DOI: 10.1002/sia.7398
Abstract: X‐ray photoelectron spectroscopy (XPS) is routinely employed to measure surface compositions. The standard approach to quantification treats the surface region as if it is homogeneous and applies sensitivity factors to measured peak intensities to calculate… read more here.
Keywords: surface analysis; quantification; surface; insight note ... See more keywords
XPS Insight Note: Coster–Kronig Broadening
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DOI: 10.1002/sia.7410
Abstract: Inconsistent peak broadening of doublet peaks in X‐ray photoelectron spectroscopy is commonly observed for many transition metals, lanthanides and actinides, which may complicate peak fitting—especially for newer practitioners. In this insight note, we discuss why… read more here.
Keywords: note coster; note; kronig broadening; insight note ... See more keywords