SiC/graphene-based test structures for the Kelvin probe microscopy instrumental function determination
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DOI: 10.21883/tpl.2023.02.55373.19396
Abstract: The paper proposes a method for determining the instrumental function for measuring the surface potential in the Kelvin probe microscopy mode. The method is based on the use of SiC samples with regions of single-layer… read more here.
Keywords: instrumental function; kelvin probe; probe microscopy; microscopy ... See more keywords