Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction.
Sign Up to like & getrecommendations! Published in 2019 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2019.112850
Abstract: Scanning diffraction uses the diffraction pattern from the sub-angstrom electron probe in scanning transmission electron microscopy (STEM) to record the probe's interaction with the sample structure. The diffraction intensity distribution carries information about the Coulomb… read more here.
Keywords: inter atomic; probe; diffraction; scanning diffraction ... See more keywords
Non-patchy strategy for inter-atomic distances from Extended X-ray Absorption Fine Structure
Sign Up to like & getrecommendations! Published in 2017 at "Scientific Reports"
DOI: 10.1038/srep42143
Abstract: Extended X-ray Absorption Fine Structure (EXAFS) has been one of the few structural probes available for crystalline, non-crystalline and even highly disordered specimens. However, the data analysis involves a patchy and tinkering process, including back-and-forth… read more here.
Keywords: ray absorption; absorption fine; inter atomic; extended ray ... See more keywords