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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5017668
Abstract: We have investigated insulator-semiconductor interface fixed charges in AlGaN/GaN metal-insulator-semiconductor (MIS) devices with Al2O3 or AlTiO (an alloy of Al2O3 and TiO2) gate dielectrics obtained by atomic layer deposition on AlGaN. Analyzing insulator-thickness dependences of…
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Keywords:
interface;
insulator semiconductor;
interface fixed;
fixed charges ... See more keywords