The evolution of resistive switching behaviors dependent on interface transition layers in Cu/Al/FTO nanostructure
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DOI: 10.1016/j.jallcom.2020.154270
Abstract: Abstract Here, the Cu/Al/FTO layered nanostructure was designed and manufactured for investigating the roles of the interface transition layers in its resistive switching (RS) behaviors. The presence of the interface transition layers was confirmed by… read more here.
Keywords: transition; transition layers; interface transition; resistive switching ... See more keywords