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Published in 2018 at "IEEE Journal of Photovoltaics"
DOI: 10.1109/jphotov.2018.2870139
Abstract: We present a combination of X-ray photoelectron spectroscopy (XPS) and time-resolved photoluminescence (TRPL) to probe the details of interface formation between CdTe and alumina deposited by atomic layer deposition (ALD). Alumina ALD using water as…
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Keywords:
interfaces cdte;
al2o3;
spectroscopy;
cdte ald ... See more keywords