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Published in 2023 at "Nano letters"
DOI: 10.1021/acs.nanolett.3c00486
Abstract: Deep traps stemming from the defects formed at the surfaces and grain boundaries of the perovskite films are the main reasons of nonradiative recombination and material degradation, which significantly affect efficiency and stability of perovskite…
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Keywords:
perovskite heterojunction;
dual interfacial;
interfacial perovskite;
perovskite ... See more keywords