Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements of Bilayer and Trilayer 2D Materials.
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DOI: 10.1002/smll.202100388
Abstract: Van der Waals materials composed of stacks of individual atomic layers have attracted considerable attention due to their exotic electronic properties that can be altered by, e.g., manipulating the twist angle of bilayer materials or the… read more here.
Keywords: layer materials; interferometric stem; bilayer trilayer; trilayer ... See more keywords