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Published in 2019 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2019.112859
Abstract: Characterizing very small particles, from a few dozen micrometers to the nanometric scale, is a very challenging application in a wide range of domains. In this work, we demonstrate, through the recovery of silica and…
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Keywords:
coherence scanning;
interferometry allows;
characterization;
scanning interferometry ... See more keywords