Evidence of 2D intersubband scattering in thin film fully depleted silicon-on-insulator transistors operating at 4.2 K
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DOI: 10.1063/5.0007100
Abstract: We report the observation at low temperature of a hump in the linear transfer characteristic of a thin film fully depleted silicon-on-insulator transistor when a positive bias is applied on the back gate under the… read more here.
Keywords: film fully; silicon insulator; thin film; fully depleted ... See more keywords