Temperature Coefficients of Crystal Defects in Multicrystalline Silicon Wafers
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DOI: 10.1109/jphotov.2020.2968111
Abstract: This article investigates the influence of crystallographic defects on the temperature sensitivity of multicrystalline silicon wafers. The thermal characteristics of the implied open-circuit voltage is assessed since it determines most of the total temperature sensitivity… read more here.
Keywords: multicrystalline silicon; temperature sensitivity; silicon wafers; temperature ... See more keywords