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Published in 2018 at "Nanoscale"
DOI: 10.1039/c8nr00793d
Abstract: Ordered mesoporous thin films of TiO2 and CexZr1-xO2 (x = 0, 0.5, 1) were prepared via an evaporation-induced self-assembly (EISA) process and subsequently investigated in terms of the developing intrinsic and residual in-plane stress. These…
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Keywords:
thin films;
intrinsic stress;
plane stress;
stress ... See more keywords