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Published in 2020 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113561
Abstract: Abstract Layout and profile adjustments are presented based on TCAD simulation to improve the inverse-mode performances of silicon-germanium heterojunction bipolar transistor (SiGe HBT). Then the single event transient (SET) and total ionizing dose (TID) sensitivity…
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Keywords:
mode;
set tid;
sige hbt;
layout profile ... See more keywords
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Published in 2018 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2018.2878471
Abstract: The cryogenic performance of radiation-hardened radio-frequency (RF) low-noise amplifiers (LNAs) is presented. The LNA, which was originally proposed for the mitigation of single-event transients (SETs) in a radiation environment, uses inverse-mode silicon-germanium (SiGe) heterojunction bipolar…
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Keywords:
mode;
low noise;
sige;
performance ... See more keywords