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Published in 2019 at "Advanced Functional Materials"
DOI: 10.1002/adfm.201903440
Abstract: Heterojunctions formed by ultrathin conductive polymer [poly(3,4‐ethylenedioxythiophene): poly(styrenesulfonate)—PEDOT:PSS] films and n‐type crystalline silicon are investigated by photoelectron spectroscopy. Large shifts of Si 2p core levels upon PEDOT:PSS deposition provide evidence that a dopant‐free p–n junction,…
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Keywords:
inversion layer;
conductive polymer;
pedot pss;
pedot ... See more keywords
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Published in 2018 at "Chinese Journal of Physics"
DOI: 10.1016/j.cjph.2018.05.029
Abstract: Abstract An electron effective mobility analytical model without empirical parameters is investigated for the strained silicon inversion layer, which can be conveniently applied by device and circuit designers. Four kinds of scattering mechanisms, i.e., coulomb…
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Keywords:
effective mobility;
mobility;
electron effective;
inversion layer ... See more keywords
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Published in 2021 at "Journal of Geophysical Research"
DOI: 10.1029/2021jd034681
Abstract: Since 2004, following prolonged stratospheric sudden warming (SSW) events, it has been observed that the stratopause disappeared and reformed at a higher altitude, forming an elevated stratopause (...
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Keywords:
sudden warming;
mesospheric inversion;
elevated stratopause;
stratospheric sudden ... See more keywords
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Published in 2023 at "Geophysical Research Letters"
DOI: 10.1029/2022gl102683
Abstract: The mesospheric inversion layer (MIL) phenomenon is a temperature enhancement (10–50 K) in a vertical layer (∼10 km) lasting several days and spanning thousands of kilometers within the mesosphere. As MILs govern the mesospheric variability,…
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Keywords:
wind temperature;
inversion;
mesospheric inversion;
temperature ... See more keywords
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Published in 2020 at "IEEE Journal of Photovoltaics"
DOI: 10.1109/jphotov.2020.2967035
Abstract: Electroluminescence (EL) characterization technique is used to quantify recombination properties in back junction silicon (Si) heterojunction (HJ) solar cell test structures with interdigitated back contact (IBC) emitters and metal contacts. These test structures are three…
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Keywords:
inversion layer;
recombination;
minority carriers;