Investigation of deposition temperature effect on spatial patterns of MgF2 thin films
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DOI: 10.1002/jemt.24246
Abstract: In this work, the atomic force microscopy (AFM) technique was used to characterize 3D MgF2 thin film surfaces through advanced analysis involving morphological, fractal, multifractal, succolarity, lacunarity and surface entropy (SE) parameters, consistent with ISO… read more here.
Keywords: deposition temperature; mgf2 thin; microscopy; investigation deposition ... See more keywords