Investigation of minority carrier traps in p-type mc-Si: Effect of firing and laser annealing
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DOI: 10.1016/j.solmat.2021.111341
Abstract: Abstract Recently, it has been shown that the investigation of minority carrier traps (traps) is a useful method to study defects in silicon wafers. In this paper, we report the presence of traps in p-type… read more here.
Keywords: traps type; carrier traps; investigation minority; laser annealing ... See more keywords