In situ TEM investigations of the microstructural changes and radiation tolerance in SiC nanowhiskers irradiated with He ions at high temperatures
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DOI: 10.1016/j.actamat.2021.116820
Abstract: Abstract Using in-situ transmission electron microscopy (TEM) with ion irradiation, we investigated the microstructural changes in silicon carbide nanowhiskers (SiC NWs) which were used as a model system for nanoporous SiC. Irradiations were carried out… read more here.
Keywords: situ tem; microstructural changes; investigations microstructural; tem investigations ... See more keywords