Spectroscopy of backscattered Cu ions detected by CR39 through grayness analysis of ion-etch tracks
Sign Up to like & getrecommendations! Published in 2019 at "Radiation Measurements"
DOI: 10.1016/j.radmeas.2019.106204
Abstract: Abstract The paper reports on a semi-automatic method for the detection and analysis of ion-etch pits generated on Solid State Nuclear Track Detectors (SSNTD) of the CR39 type. The CR39 detectors have been exposed to… read more here.
Keywords: ion etch; ion; analysis ion; spectroscopy ... See more keywords
The effect of reactive ion etch (RIE) process conditions on ReRAM device performance
Sign Up to like & getrecommendations! Published in 2017 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/aa7eed
Abstract: The recent surge of research on resistive random access memory (ReRAM) devices has resulted in a wealth of different materials and fabrication approaches. In this work, we describe the performance implications of utilizing a reactive… read more here.
Keywords: ion etch; etch; performance; reactive ion ... See more keywords