Attenuation of doubly charged ion interferences on arsenic and selenium by ICP-MS under low kinetic energy collision cell conditions with hydrogen cell gas
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DOI: 10.1039/d0ja00301h
Abstract: Most spectral interferences that arise in ICP-MS are caused by matrix or plasma-based ion overlaps on an analyte ion. These interferences can be effectively controlled using collision/reaction cell (CRC) technology operating in helium (He) collision… read more here.
Keywords: collision cell; collision; doubly charged; ion interferences ... See more keywords