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Published in 2020 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2020.113175
Abstract: The angle-resolved electron scattering is investigated in scanning-transmission electron microscopy (STEM) using a motorised iris aperture placed above a conventional annular detector. The electron intensity scattered into various angle ranges is compared with simulations that…
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Keywords:
sources error;
angle;
iris aperture;
resolved stem ... See more keywords