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Published in 2019 at "Semiconductors"
DOI: 10.1134/s1063782619060071
Abstract: For the first time, comprehensive comparative investigations of ultraviolet photodetectors with Cr Schottky barriers formed on 4H-SiC epitaxial layers are carried out by the X-ray and optical methods before and after irradiation with 15-MeV protons…
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Keywords:
sic photodetectors;
photodetectors schottky;
proton irradiation;
schottky barriers ... See more keywords