Fast neutron irradiation tests of flash memories used in space environment at the ISIS spallation neutron source
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DOI: 10.1063/1.5017945
Abstract: This paper presents a neutron accelerated study of soft errors in advanced electronic devices used in space missions, i.e. Flash memories performed at the ChipIr and VESUVIO beam lines at the ISIS spallation neutron source.… read more here.
Keywords: neutron; space; flash memories; isis spallation ... See more keywords