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Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.05.262
Abstract: Abstract The valence band offsets in rf-sputtered Indium Tin Oxide (ITO)/single crystal β-Ga2O3 (ITO/Ga2O3) heterostructures were measured with X-Ray Photoelectron Spectroscopy using the Kraut method. The bandgaps of the component materials in the heterostructure were…
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Keywords:
offsets ito;
ito heterostructures;
ga2o3;
band offsets ... See more keywords