Evaluation of Voltage-Matched 2T Multi-Junction Modules Based on Monte Carlo Ray Tracing
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DOI: 10.3390/en16114292
Abstract: As Si single-junction technology is approaching its Shockley–Queisser theoretical limit, relevant efforts are being expended towards the development of multi-junction modules. In this work, we employ an optical model based on Monte Carlo ray tracing… read more here.
Keywords: monte carlo; based monte; junction modules; carlo ray ... See more keywords