Tutorial: Junction spectroscopy techniques and deep-level defects in semiconductors
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DOI: 10.1063/1.5011327
Abstract: The term junction spectroscopy embraces a wide range of techniques used to explore the properties of semiconductor materials and semiconductor devices. In this tutorial review, we describe the most widely used junction spectroscopy approaches for… read more here.
Keywords: junction spectroscopy; level defects; spectroscopy; deep level ... See more keywords