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Published in 2020 at "Journal of Power Electronics"
DOI: 10.1007/s43236-020-00178-5
Abstract: In this paper, an online junction temperature monitoring method based on the on-state voltage under high collector current density measurements for IGBT power modules is proposed. Unlike the conventional junction temperature monitoring method, the presented…
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Keywords:
online monitoring;
monitoring igbt;
junction;
igbt junction ... See more keywords
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Published in 2021 at "Optik"
DOI: 10.1016/j.ijleo.2021.166535
Abstract: Abstract Advantages of LEDs include high brightness, reliability, low power consumption and a long life. These advantages have made LEDs feasible in a wide range of automotive lamps applications. However, LEDs are semiconductor p-n junction…
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Keywords:
current feed;
control;
temperature;
junction temperature ... See more keywords
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Published in 2021 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2020.111451
Abstract: Abstract Light-emitting diodes (LEDs) have become a promising solid-state light source in numerous applications. During operation, they are often exposed to high environmental temperatures, resulting in performance and reliability degradation. It is thus important to…
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Keywords:
operated high;
temperature;
junction temperature;
analysis ... See more keywords
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Published in 2021 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2021.114267
Abstract: Abstract The insulated-gate bipolar transistor (IGBT) is one of the most widely used power transistors in switching and industrial control systems. Its actual junction temperature plays a critical factor in determining the dynamic performance, reliability…
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Keywords:
junction temperature;
learning machine;
extreme learning;
junction ... See more keywords
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Published in 2017 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2017.01.033
Abstract: Abstract Originating from a non-radiative recombination in the active region of a light-emitting diode (LED), the self-heating effect was investigated under continuous wave ( cw ) operation with a GaInN blue LED. Current–voltage (I–V) characteristics…
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Keywords:
temperature;
light emitting;
gainn blue;
junction temperature ... See more keywords
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Published in 2024 at "IET Power Electronics"
DOI: 10.1049/pel2.12708
Abstract: In order for full utilization of the switching devices and safe continued operation of the power converter at the same time, the junction temperature of the switching devices needs to be accurately monitored without shutting…
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Keywords:
junction temperature;
network theory;
junction;
calculation method ... See more keywords
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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5026650
Abstract: We acknowledge the financial support from the King Abdulaziz City for Science and Technology (KACST), Grant No. KACST TIC R2-FP-008. This work was partially supported by the King Abdullah University of Science and Technology (KAUST)…
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Keywords:
quantum disks;
temperature ultraviolet;
algan quantum;
diode junction ... See more keywords
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Published in 2020 at "AIP Advances"
DOI: 10.1063/5.0005473
Abstract: The junction temperature, one of the major parameters that strongly affect the performance of light-emitting diodes (LEDs), increases during operation because of the power dissipated as heat within an LED device. Therefore, LED devices with…
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Keywords:
junction temperature;
deep ultraviolet;
emitting diodes;
light emitting ... See more keywords
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Published in 2024 at "AIP Advances"
DOI: 10.1063/5.0168625
Abstract: Laser junction temperature (Tj) is an essential parameter that directly affects the light power and lifetime of semiconductor lasers. Here, we investigate the effect of Tj on an InAs/GaAs quantum dot (QD) laser grown on…
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Keywords:
temperature;
junction temperature;
quantum dot;
inas gaas ... See more keywords
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Published in 2018 at "Metrologia"
DOI: 10.1088/1681-7575/aaaed2
Abstract: We have developed spectral models describing the electroluminescence spectra of AlGaInP and InGaN light-emitting diodes (LEDs) consisting of the Maxwell–Boltzmann distribution and the effective joint density of states. One spectrum at a known temperature for…
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Keywords:
temperature;
junction temperature;
emitting diodes;
electroluminescence ... See more keywords
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Published in 2024 at "IEEE Journal of Emerging and Selected Topics in Power Electronics"
DOI: 10.1109/jestpe.2024.3387697
Abstract: The junction temperature and aging levels are critical factors contributing to power device failures. Existing methods commonly employ electrical parameters as indicators for their evaluation. However, these indicators are influenced by both the junction temperature…
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Keywords:
junction temperature;
temperature aging;
aging level;