Online monitoring of IGBT junction temperature based on Vce measurement
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Power Electronics"
DOI: 10.1007/s43236-020-00178-5
Abstract: In this paper, an online junction temperature monitoring method based on the on-state voltage under high collector current density measurements for IGBT power modules is proposed. Unlike the conventional junction temperature monitoring method, the presented… read more here.
Keywords: online monitoring; monitoring igbt; junction; igbt junction ... See more keywords
Junction temperature control for the automotive LED lamp based on the current feed forward strategy
Sign Up to like & getrecommendations! Published in 2021 at "Optik"
DOI: 10.1016/j.ijleo.2021.166535
Abstract: Abstract Advantages of LEDs include high brightness, reliability, low power consumption and a long life. These advantages have made LEDs feasible in a wide range of automotive lamps applications. However, LEDs are semiconductor p-n junction… read more here.
Keywords: current feed; control; temperature; junction temperature ... See more keywords
Precise measurement of junction temperature by thermal analysis of light-emitting diode operated at high environmental temperature
Sign Up to like & getrecommendations! Published in 2021 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2020.111451
Abstract: Abstract Light-emitting diodes (LEDs) have become a promising solid-state light source in numerous applications. During operation, they are often exposed to high environmental temperatures, resulting in performance and reliability degradation. It is thus important to… read more here.
Keywords: operated high; temperature; junction temperature; analysis ... See more keywords
Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine
Sign Up to like & getrecommendations! Published in 2021 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2021.114267
Abstract: Abstract The insulated-gate bipolar transistor (IGBT) is one of the most widely used power transistors in switching and industrial control systems. Its actual junction temperature plays a critical factor in determining the dynamic performance, reliability… read more here.
Keywords: junction temperature; learning machine; extreme learning; junction ... See more keywords
Junction temperature rise due to self-heating effects in GaInN blue light-emitting diodes
Sign Up to like & getrecommendations! Published in 2017 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2017.01.033
Abstract: Abstract Originating from a non-radiative recombination in the active region of a light-emitting diode (LED), the self-heating effect was investigated under continuous wave ( cw ) operation with a GaInN blue LED. Current–voltage (I–V) characteristics… read more here.
Keywords: temperature; light emitting; gainn blue; junction temperature ... See more keywords
Diode junction temperature in ultraviolet AlGaN quantum-disks-in-nanowires
Sign Up to like & getrecommendations! Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5026650
Abstract: We acknowledge the financial support from the King Abdulaziz City for Science and Technology (KACST), Grant No. KACST TIC R2-FP-008. This work was partially supported by the King Abdullah University of Science and Technology (KAUST)… read more here.
Keywords: quantum disks; temperature ultraviolet; algan quantum; diode junction ... See more keywords
Counter-intuitive junction temperature behavior in AlGaN-based deep-ultraviolet light-emitting diodes
Sign Up to like & getrecommendations! Published in 2020 at "AIP Advances"
DOI: 10.1063/5.0005473
Abstract: The junction temperature, one of the major parameters that strongly affect the performance of light-emitting diodes (LEDs), increases during operation because of the power dissipated as heat within an LED device. Therefore, LED devices with… read more here.
Keywords: junction temperature; deep ultraviolet; emitting diodes; light emitting ... See more keywords
Relationships between junction temperature, electroluminescence spectrum and ageing of light-emitting diodes
Sign Up to like & getrecommendations! Published in 2018 at "Metrologia"
DOI: 10.1088/1681-7575/aaaed2
Abstract: We have developed spectral models describing the electroluminescence spectra of AlGaInP and InGaN light-emitting diodes (LEDs) consisting of the Maxwell–Boltzmann distribution and the effective joint density of states. One spectrum at a known temperature for… read more here.
Keywords: temperature; junction temperature; emitting diodes; electroluminescence ... See more keywords
A Microscopic Hyperspectral-Based Centroid Wavelength Method for Measuring Two-Dimensional Junction Temperature Distribution of LEDs
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2019.2900841
Abstract: In this letter, we propose an experimental method for determining two-dimensional (2D) junction temperature distribution of light-emitting diodes (LEDs) using microscopic hyperspectral-based centroid wavelength. The 2D centroid wavelength matrix is extracted from the hyperspectral data… read more here.
Keywords: temperature; junction temperature; temperature distribution; centroid wavelength ... See more keywords
A Comparative Study on the Junction Temperature Measurements of LEDs With Raman Spectroscopy, Microinfrared (IR) Imaging, and Forward Voltage Methods
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/tcpmt.2018.2799488
Abstract: Energy efficiency, long life, exceptional color, and performance of solid-state light sources have resulted in a rapidly increasing trend in a number of practical applications especially for general lighting after a long history of incandescent… read more here.
Keywords: forward voltage; spectroscopy; junction; raman spectroscopy ... See more keywords
Calibration Method of Junction Temperature Measurement for Press-Pack IGBTs
Sign Up to like & getrecommendations! Published in 2021 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/tcpmt.2021.3084966
Abstract: Accurate junction temperature measurement is of great significance for the reliability assessment of power insulated-gate bipolar transistor (IGBT) devices. The $V_{\mathrm {CE}}(T)$ method is the most widely used junction temperature measurement method and is recommended… read more here.
Keywords: calibration; method; temperature; junction temperature ... See more keywords