Investigation of Junctionless Fin-FET Characterization in Deep Cryogenic Temperature: DC and RF analysis
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DOI: 10.1109/access.2022.3228165
Abstract: This work presents the SOI Junctionless Fin-FET characterization in Deep Cryogenic behavior (DC-JLFET). Results show that the JLT device is well-suited for various operations, such as computation, sensing, and communication in the quantum field. The… read more here.
Keywords: fin fet; characterization deep; deep cryogenic; junctionless fin ... See more keywords