A Comparative Study on Hot-Carrier Injection in 5-Story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs
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DOI: 10.1109/led.2017.2772871
Abstract: The hot-carrier degradation of the junctionless mode (JM) and the inversion mode (IM) of five-story vertically integrated gate-all-around (GAA) MOSFETs is investigated for the first time. It is found that the degradation of drain current… read more here.
Keywords: mode; junctionless mode; vertically integrated; inversion mode ... See more keywords