Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays
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DOI: 10.1021/acs.jpcc.6b12771
Abstract: Resistive random access memories (RRAM) require high density, low power consumption and high reliability. Systematic statistic electrical, material and theoretical studies were demonstrated in this work to point out and clarify a key impact of… read more here.
Keywords: resistive random; key impact; carbon; random access ... See more keywords