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Published in 2020 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2020.111435
Abstract: Abstract For high quality imaging of materials in nanoscale by hard X-ray optics, high resolution lenses with high focusing/imaging efficiency are needed. Refraction based conventional Kinoform lenses with 1D linear configuration in Si has been…
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Keywords:
beam lithography;
hard ray;
optics;
kinoform ... See more keywords