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Published in 2019 at "Surfaces and Interfaces"
DOI: 10.1016/j.surfin.2019.02.003
Abstract: Abstract Ratio of two peaks in X-ray induced vanadium L3M23M45 Auger electron spectra has been used to monitor oxidation state of V2O3 thin film surface followed by vacuum annealing. The V2O3 film was grown with…
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Keywords:
auger electron;
l3m23m45 auger;
vanadium;
film ... See more keywords