Mathematical models and methods for functional control of large-scale integrated circuits at the stage of their production
Sign Up to like & getrecommendations! Published in 2019 at "International Journal of Nanotechnology"
DOI: 10.1504/ijnt.2019.102402
Abstract: The paper proposes a hardware-software complex for generating functional tests for the equipment Advantest V93000, AEHR MAX3B, etc., working on the basis of the original software and the original language for the description of functional… read more here.
Keywords: state; high level; functional tests; programming language ... See more keywords