Hard x-ray photoemission study on strain effect in LaNiO3 thin films
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DOI: 10.1063/5.0044047
Abstract: The strain effect from a substrate is an important experimental route to control electronic and magnetic properties in transition-metal oxide (TMO) thin films. Using hard x-ray photoemission spectroscopy, we investigate the strain dependence of the… read more here.
Keywords: hard ray; thin films; lanio3 thin; ray photoemission ... See more keywords