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Published in 2018 at "Nano letters"
DOI: 10.1021/acs.nanolett.8b02742
Abstract: Kelvin probe force microscopy (KPFM) has been used to directly and quantitatively measure Hall voltages, developed at conducting tail-to-tail domain walls in ErMnO3 single crystals, when current is driven in the presence of an approximately…
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Keywords:
carrier mobilities;
hall;
carrier;
large carrier ... See more keywords