Free-electron laser data for multiple-particle fluctuation scattering analysis
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DOI: 10.1038/sdata.2018.201
Abstract: Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several orders of magnitude… read more here.
Keywords: electron laser; free electron; diffraction patterns; particle ... See more keywords