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Published in 2019 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2019.2920629
Abstract: This paper presents a compact model of latchup considering design and process dependence. The new approach is more realistic and inspirited from the classical model. This model was used to confirm the single-event latchup (SEL)…
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Keywords:
single event;
event latchup;
compact modeling;
latchup ... See more keywords