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Published in 2020 at "Journal of Instrumentation"
DOI: 10.1088/1748-0221/15/01/p01010
Abstract: A Talbot-Lau scanner enables fast grating-based X-ray phase-contrast and dark-field imaging of large samples. We present a fast and robust scanning method based on continuous phase-sampling during the usual scan process. For that purpose the…
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Keywords:
phase;
phase sampling;
method;
talbot lau ... See more keywords