The environmental stability characterization of exfoliated few-layer CrXTe3 (X = Si, Ge) nanosheets
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DOI: 10.1016/j.apsusc.2020.145452
Abstract: Abstract Two dimensional van der Waals layered CrXTe3 (X = Si, Ge) crystals have attracted great attention recently due to the observation of fascinating long range magnetic order. However, the detailed environmental stability of surface chemical reactivity… read more here.
Keywords: exfoliated layer; microscopy; crxte3; environmental stability ... See more keywords