Articles with "layer exchange" as a keyword



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Impact of the carbon membrane inserted below Ni in the layer exchange of multilayer graphene

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Published in 2020 at "CrystEngComm"

DOI: 10.1039/d0ce00394h

Abstract: High-quality multilayer graphene on glass is achieved at a low temperature (400 °C). Ni-Induced layer exchange with an amorphous C membrane below Ni enhances the supersaturation of Ni with C. This lowers the layer exchange… read more here.

Keywords: layer exchange; multilayer graphene; membrane; impact carbon ... See more keywords

High-quality multilayer graphene on insulators via metal catalyst alloying in layer exchange with Bayesian optimization

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Published in 2025 at "CrystEngComm"

DOI: 10.1039/d5ce00061k

Abstract: Multilayer graphene was synthesized on glass via metal-induced layer exchange using Ni–Co–Fe alloy catalysts. Bayesian optimization identified the optimal composition, achieving high crystallinity suitable for next-generation electronics. read more here.

Keywords: layer exchange; multilayer graphene; via metal; bayesian optimization ... See more keywords
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Zn-induced layer exchange of p- and n-type nanocrystalline SiGe layers for flexible thermoelectrics

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Published in 2020 at "Applied Physics Letters"

DOI: 10.1063/5.0006958

Abstract: Fermi-level control in a polycrystalline SiGe layer is challenging, especially under a low thermal budget owing to the low activation rate of impurities and defect-induced acceptors. Here, we demonstrate the low-temperature (120–350 °C) synthesis of nanocrystalline… read more here.

Keywords: sige layers; layer exchange; sige; type sige ... See more keywords

Silver-induced layer exchange and crystallization of a-Si films investigated using in situ scanning transmission electron microscopy

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Published in 2024 at "Journal of Applied Physics"

DOI: 10.1063/5.0218143

Abstract: Ag-induced crystallization and layer exchange (AgILE) in a stack of amorphous Si/Ag/quartz substrate has been investigated using optical microscopy, scanning electron microscopy, transmission electron microscopy (TEM), scanning TEM-high angle annular dark field (STEM-HAADF) imaging, and… read more here.

Keywords: electron microscopy; crystallization; dendricity; microscopy ... See more keywords