Modified Inverted Layer Processing of Ultrathin Touch Sensor Impregnating Ag Nanowires with Both Enlarged Surface Coverage of Conductive Pathways and Ultralow Roughness
Sign Up to like & getrecommendations! Published in 2020 at "Electronic Materials Letters"
DOI: 10.1007/s13391-020-00213-4
Abstract: Although previous studies have shown that Ag nanowire (AgNW) is among the most powerful means to replace the brittle indium tin oxide, physically flexible devices using AgNWs are not yet available on the market mainly… read more here.
Keywords: surface; surface coverage; coverage; modified inverted ... See more keywords
Conversion reactions in atomic layer processing with emphasis on ZnO conversion to Al2O3 by trimethylaluminum
Sign Up to like & getrecommendations! Published in 2021 at "Journal of Vacuum Science and Technology"
DOI: 10.1116/6.0000680
Abstract: Atomic layer processing such as atomic layer deposition (ALD) and thermal atomic layer etching (ALE) is usually described in terms of sequential, self-limiting surface reactions. This picture for ALD and thermal ALE leaves out the… read more here.
Keywords: atomic layer; zno; conversion; reaction ... See more keywords
Determination of the optical constants of a dielectric layer by processing in situ spectral transmittance measurements along the time dimension.
Sign Up to like & getrecommendations! Published in 2017 at "Applied optics"
DOI: 10.1364/ao.56.00c181
Abstract: This paper describes a new method based on the use of a broadband monitoring system to determine the spectral dependence of the optical constants of a layer without using a dispersion model. read more here.
Keywords: constants dielectric; dielectric layer; layer; optical constants ... See more keywords