Defect generation in Pd layers by ‘smart’ films with high H-affinity
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DOI: 10.1038/s41598-017-09900-z
Abstract: In this paper, we demonstrate that the microstructure and the surface of a thin palladium (Pd) film can be intentionally altered by the presence of a subjacent niobium (Nb) film. Depending on the thickness of… read more here.
Keywords: microscopy; generation layers; layers smart; smart films ... See more keywords