Articles with "leakage currents" as a keyword



Strong composition dependence of resistive switching in Ba1-xSrxTiO3 thin films on semiconducting substrates and its thermodynamic analysis

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Published in 2018 at "Acta Materialia"

DOI: 10.1016/j.actamat.2018.02.015

Abstract: Abstract In this work, we report on the variability of the Schottky effect in solution processed Ba1-xSrxTiO3 films (BST, x = 0, 0.5) grown on 0.5% Nb doped SrTiO3 substrates with top Pt electrodes (NSTO/BST/Pt). The films… read more here.

Keywords: ba1 xsrxtio3; polarization; strong composition; xsrxtio3 ... See more keywords
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Leakage currents and Fermi-level shifts in GaN layers upon iron and carbon-doping

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Published in 2017 at "Journal of Applied Physics"

DOI: 10.1063/1.4993180

Abstract: Semi-insulating GaN is a prerequisite for lateral high frequency and high power electronic devices to isolate the device region from parasitic conductive channels. The commonly used dopants for achieving semi-insulating GaN, Fe, and C cause… read more here.

Keywords: carbon; gan layers; currents fermi; level shifts ... See more keywords

Nanoscale electrical conductance and leakage currents in etched and selective-area regrown GaAs pn junctions

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Published in 2025 at "Journal of Applied Physics"

DOI: 10.1063/5.0240080

Abstract: Analysis and mitigation of junction leakage currents are central to the engineering of vertical semiconductor diode structures. We have used scanning capacitance microscopy and conductive atomic force microscopy to characterize, with nanoscale spatial resolution, charge… read more here.

Keywords: area regrown; junction; selective area; leakage currents ... See more keywords

Six-year Trial of an HV Overhead Line Wide-bodied Composite Insulator

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Published in 2020 at "IEEE Transactions on Dielectrics and Electrical Insulation"

DOI: 10.1109/tdei.2020.008857

Abstract: This paper addresses the long-term aging of silicone rubber shedded insulators mounted horizontally, and specifically relates the experience from a highly monitored six-year trial of two composite cross-arms designed for 400 kV. Weather conditions and… read more here.

Keywords: leakage currents; year trial; six year;

Evaluation of Leakage Currents of Semiconductor Packages Due to High-Voltage Stress Under an Immersion Cooling Environment

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Published in 2025 at "Applied Sciences"

DOI: 10.3390/app15094668

Abstract: As data centers expand, immersion cooling systems are gaining attention for thermal management of memory devices. To enable widespread adoption, it is essential to evaluate the impact of coolants on the reliability of memory packages.… read more here.

Keywords: immersion cooling; stress; voltage; high voltage ... See more keywords