Sign Up to like & get
recommendations!
1
Published in 2017 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927617001635
Abstract: While single event detection based imaging, referred to as electron counting, is starting to be widely adopted, several challenges still remain. One of these is, accurately identifying the entry point of the primary electron given…
read more here.
Keywords:
electron puddles;
secondary electron;
learn shapes;
shapes secondary ... See more keywords