Deep Learning for Atomically Resolved Imaging
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DOI: 10.1017/s143192761800079x
Abstract: Recent advances in scanning transmission electron microscopy (STEM) and scanning tunneling microscopy (STM) allow unprecedented opportunities in probing the materials structural parameters and electronic properties in real space with an angstrom-level precision. These experimental capabilities… read more here.
Keywords: resolved imaging; microscopy; deep learning; learning atomically ... See more keywords