Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook.
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DOI: 10.1039/d2nh00377e
Abstract: In the last few years, electron microscopy has experienced a new methodological paradigm aimed to fix the bottlenecks and overcome the challenges of its analytical workflow. Machine learning and artificial intelligence are answering this call… read more here.
Keywords: learning electron; outlook; electron microscopy; machine learning ... See more keywords