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On Diagnosing the Aging Level of Automotive Semiconductor Devices

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Published in 2017 at "IEEE Transactions on Circuits and Systems II: Express Briefs"

DOI: 10.1109/tcsii.2016.2601959

Abstract: Semiconductor aging is a serious threat to the reliability of a system. We address the aging level of semiconductor components by describing the degree of semiconductor aging under certain operating conditions, including voltage, frequency, temperature,… read more here.

Keywords: diagnosing aging; automotive semiconductor; semiconductor; semiconductor devices ... See more keywords