Wafer-Level Characterization of Silicon Nitride CWDM (De)Multiplexers Using Bayesian Inference
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DOI: 10.1109/lpt.2020.3004850
Abstract: A cascaded Mach-Zehnder interferometer based filter for coarse wavelength (de)multiplexing (CWDM) at the O-band is fabricated and tested on a silicon nitride on SOI platform. We characterize the chip-to-chip performance variability of the filter devices… read more here.
Keywords: bayesian inference; wafer level; silicon nitride; level characterization ... See more keywords