ESD Protection Design for Touch Panel Control IC Against Latchup-Like Failure Induced by System-Level ESD Test
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DOI: 10.1109/ted.2016.2642042
Abstract: Due to the snapback holding voltage of high-voltage (HV) nMOS smaller than the maximum operating voltage, the traditional power-rail electrostatic discharge (ESD) clamp circuit implemented with such HV nMOS suffered latchup-like failure in a touch… read more here.
Keywords: voltage; esd test; level esd; system level ... See more keywords