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Published in 2017 at "Microsystem Technologies"
DOI: 10.1007/s00542-016-2977-1
Abstract: Suspended inductors and 2.45 GHz BPF with patterned ground shields on the lossy silicon substrate by using Cu/BCB based wafer level packaging and bulk Si etching technologies were fabricated. Thick BCB interlayer is used as the…
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Keywords:
wafer level;
level packaging;
band;
pass ... See more keywords
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Published in 2017 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/ectc.2017.309
Abstract: In this paper, the warpage and thermal performances of fan-out wafer-level packaging (FOWLP) are investigated. Emphasis is placed on the characterization of the effects of FOWLP important parameters, such as chip size, chip thickness, package/chip…
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Keywords:
wafer level;
level packaging;
warpage thermal;
warpage ... See more keywords
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Published in 2018 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/tcpmt.2018.2848665
Abstract: The design, materials, process, fabrication, and reliability of a heterogeneous integration of four chips by a fan-out panel-level packaging (FOPLP) method are investigated in this paper. Emphasis is placed on the application of a special…
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Keywords:
panel level;
heterogeneous integration;
level packaging;
fan panel ... See more keywords
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Published in 2023 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/tcpmt.2023.3267411
Abstract: Considerable advancements in power semiconductor devices have resulted in such devices being increasingly adopted in applications of energy generation, conversion, and transmission. Hence, we proposed a fan-out panel-level packaging (FOPLP) design for 30-V Si-based metal–oxide–semiconductor…
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Keywords:
ant colony;
packaging;
reliability;
panel level ... See more keywords
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Published in 2017 at "IEEE Transactions on Industrial Informatics"
DOI: 10.1109/tii.2016.2643694
Abstract: To develop integrated circuit (IC) test of wafer-level packaging, the electromechanical model of microprobe testing process and the IC final test system of wafer-level packaging based on microprobe arrays are first proposed. An electromechanical model…
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Keywords:
wafer level;
level packaging;
system;
test ... See more keywords