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Published in 2017 at "Journal of Materials Science"
DOI: 10.1007/s10853-017-1217-0
Abstract: Abstract The undoped and B-doped polycrystalline diamond thin film was synthesized by hot filament chemical vapor deposition and microwave plasma, respectively. The structural characterization was performed by scanning electron microscopy, X-ray diffraction and Raman spectroscopy.…
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Keywords:
deep level;
level transient;
polycrystalline diamond;
spectroscopy ... See more keywords
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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5019958
Abstract: We investigate the relationship between the intensity of band-edge (BDE) photoluminescence (PL) from 10 to 70 K and the concentration of iron diffused in boron-doped p-type silicon. Because of the nonradiative recombination activity of the interstitial…
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Keywords:
transient spectroscopy;
deep level;
level transient;
photoluminescence ... See more keywords
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Published in 2023 at "Applied Physics Letters"
DOI: 10.1063/5.0144783
Abstract: The lifetime of deep-ultraviolet light-emitting diodes (LEDs) is still limited by a number of factors, which are mainly related to semiconductor defects, and still need to be clarified. This paper improves the understanding of UV…
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Keywords:
deep level;
spectroscopy;
level transient;
transient spectroscopy ... See more keywords
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Published in 2021 at "Journal of Physics D: Applied Physics"
DOI: 10.1088/1361-6463/ac34ad
Abstract: Very often deep level transient spectroscopy (DLTS) specimens deviate from ideal textbook examples, making the interpretation of spectra a huge challenge. This challenge introduces inaccurate estimates of emission signatures and the lack of appropriate estimates…
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Keywords:
level transient;
purity germanium;
high purity;
deep level ... See more keywords
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Published in 2018 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/aacd54
Abstract: In-situ measurements such as deep level transient spectroscopy (DLTS) provide reliable information for the identification of defects in electronic devices. For GaN-based devices exposed to swift heavy ion (SHI) irradiation, in situ DLTS investigations are…
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Keywords:
transient spectroscopy;
deep level;
level transient;
ion ... See more keywords